Effects of annealing to tunnel junction stability

AIP Conference Proceedings

Volumn 850, Issue , 2006, Pages 1639-1640

  Koppinen, P J ^a   Vaisto L M ^a   Maasilta, I J ^a  

^a UNIVERSITY OF JYVÄSKYLÄ   (Finland)

Author keywords

Annealing; Single electron devices; Tunnel junctions

Indexed keywords

EID: 33846977120     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2355335     Document Type: Conference Paper

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