Positronium as a probe of transient paramagnetic centers in a- SiO2

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 8, 2007, Pages

  Cassidy, D B ^a   Yokoyama, K T ^a   Deng, S H M ^a   Griscom, D L ^b   Miyadera, H ^a   Tom, H W K ^a   Varma, C M ^a   Mills Jr , A P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b ImpactGlass Research International   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846919301     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.085415     Document Type: Article

References (42)

1. E.g., Silicon-Based Materials and Devices, edited by, H. S. Nalwa, (Academic, San Diego, 2001).
2. P. W. Anderson, B. I. Halperin, and C. M. Varma, Philos. Mag. PHMAA4 0031-8086 25, 1 (1972);
3. W. A. Phillips, J. Low Temp. Phys. JLTPAC 0022-2291 10.1007/BF00660072 7, 351 (1972);
4. C. C. Yu and A. J. Leggett, Comments Condens. Matter Phys. CCMPEB 0885-4483 14, 231 (1988).
5. Defects in SiO2 and Related Dielectrics: Science and Technology, edited by, G. Pacchioni,,, L. Skuja,, and, D. L. Griscom, (Kluwer Academic Publishers, Dordrecht, 2000).
6. D. L. Griscom, in Glass Science and Technology, Vol. 4B, Advances in Structural Analysis, edited by, D. R. Uhlmann, and, N. J. Kreidl, (Academic Press, New York, 1990), p. 151;
7. D. L. Griscom, in Defects in SiO2 and Related Dielectrics: Science and Technology (Ref.), p. 117.
8. L. Skuja, in Defects in SiO2 and Related Dielectrics: Science and Technology (Ref.), p. 73.
9. D. L. Griscom, in Encyclopedia of Materials: Science and Technology (Elsevier Science, Amsterdam, 2001), p. 179.
10. For example, I. A. Shkrob and A. D. Trifunac, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.54.15073 54, 15073 (1996).
11. For example, K. Kajihara, L. Skuja, M. Hirano, and H. Hosono, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.89.135507 89, 135507 (2002).
12. R. Paulin and G. Ambrosino, J. Phys. (France) JOPQAG 0302-0738 29, 263 (1968);
13. Y. Nagashima, Y. Morinaka, T. Kurihara, Y. Nagai, T. Hyodo, T. Shidara, and K. Nakahara, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.58.12676 58, 12676 (1998).
14. M. Deutsch, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.82.455 82, 455 (1951);
15. R. A. Ferrell, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.110.1355 110, 1355 (1958).
16. E.g., M. Eldrup, V. P Shantarovich, and O. E. Mogensen, Chem. Phys. CMPHC2 0301-0104 10.1016/0301-0104(75)80046-2 11, 129 (1975).
17. D. B. Cassidy, S. H. M. Deng, R. G. Greaves, and A. P. Mills, Jr., Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.2221509 77, 073106 (2006).
18. A. P. Mills, Jr., and E. M. Gullikson, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.97441 49, 1121 (1986).
19. C. M. Surko and R. G. Greaves, Phys. Plasmas PHPAEN 1070-664X 10.1063/1.1651487 11, 2333 (2004).
20. H. K. M. Tanaka, T. Kurihara, and A. P. Mills, Jr., Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.193408 72, 193408 (2005).
21. A. N. Trukhin, in Defects in SiO2 and Related Dielectrics: Science and Technology (Ref.), p. 235.
22. D. B. Cassidy, S. H. M. Deng, H. K. M. Tanaka, and A. P. Mills, Jr., Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2203336 88, 194105 (2006).
23. P. J. Schultz and K. G. Lynn, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.60.701 60, 701 (1988).
24. M. Charlton and J. W. Humberston, Positron Physics (Cambridge University Press, Cambridge, U.K., 2001);
25. D. W. Gidley, K. G. Lynn, M. P. Petkov, J. N. Sun, M. H. Weber, and A. F. Yee, in New Directions in Antimatter Chemistry and Physics, edited by, C. M. Surko, and, F. A. Gianturco, (Kluwer Academic Publishers, Dordrecht, 2001), p. 151.
26. A. P. Mills, Jr., E. D. Shaw, R. J. Chichester, and D. M. Zuckerman, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.40.2045 40, 2045 (1989).
27. H. Saito and T. Hyodo, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.60. 11070 60, 11070 (1999).
28. D. L. Griscom, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.64.174201 64, 174201 (2001).
29. R. Kohlrausch, Ann. Phys. ANPYA2 0003-3804 12, 393 (1847).
30. S. Girard, D. L. Griscom, J. Baggio, B. Brichard, and F. Berghmans, J. Non-Cryst. Solids JNCSBJ 0022-3093 352, 2637 (2006).
31. D. L. Griscom and M. Mizuguchi, J. Non-Cryst. Solids JNCSBJ 0022-3093 239, 1212 (1998).
32. T. E. Tsai and D. L Griscom, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.67.2517 67, 2517 (1991).
33. T. H. DiStephano and D. E. Eastman, Solid State Commun. SSCOA4 0038-1098 10.1016/0038-1098(71)90643-0 9, 2259 (1971).
34. A. Cannizzo, S. Agnello, S. Grandi, M. Leone, A. Magistris, and V. A. Radzig, J. Non-Cryst. Solids JNCSBJ 0022-3093, 351, 1805 (2005).
35. V. A. Radzig, in Defects in SiO2 and Related Dielectrics: Science and Technology (Ref.), p. 339.
36. Sai S. Prakash, C. Jeffrey Brinker, A. J. Hurd, and S. M. Rao, Nature (London) NATUAS 0028-0836 10.1038/374439a0 374, 439 (2002).
37. D. L. Griscom, C. J. Brinker, and C. S. Ashley, J. Non-Cryst. Solids JNCSBJ 0022-3093 92, 295 (1987).
38. W. R. Austin and R. G. Leisure, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.54.15064 54, 15064 (1996).
39. B. J. Siwick, J. R. Dwyer, R. E. Jordan, and R. J. Dwayne-Miller, Science SCIEAS 0036-8075 10.1126/science.1090052 302, 1382 (2003);
40. H. Dömer and O. Bostanjoglo, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1611612 74, 4369 (2003).
41. G. Hochstrasser and J. F. Antonini, Surf. Sci. SUSCAS 0039-6028 10.1016/0039-6028(72)90192-6 32, 644 (1972).
42. T. Nash, A. C. Alison, and J. S. Harington, Nature (London) NATUAS 0028-0836 211, 259 (1966).