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Volumn 255, Issue 1 SPEC. ISS., 2007, Pages 101-104
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Detailed characterization of defect production in molecular dynamics simulations of cascades in Si
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Author keywords
Amorphous; Cascades; Molecular dynamics; Point defects; Silicon
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Indexed keywords
AMORPHOUS SILICON;
CHEMICAL ANALYSIS;
COMPUTER SIMULATION;
CRYSTAL STRUCTURE;
POINT DEFECTS;
BONDING TOPOLOGY;
MOLECULAR DYNAMICS SIMULATION;
RADIATION CASCADES;
RECOIL ENERGIES;
SEITZ CELL ANALYSIS;
MOLECULAR DYNAMICS;
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EID: 33846906449
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2006.11.013 Document Type: Article |
Times cited : (22)
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References (22)
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