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Volumn 255, Issue 1 SPEC. ISS., 2007, Pages 101-104

Detailed characterization of defect production in molecular dynamics simulations of cascades in Si

Author keywords

Amorphous; Cascades; Molecular dynamics; Point defects; Silicon

Indexed keywords

AMORPHOUS SILICON; CHEMICAL ANALYSIS; COMPUTER SIMULATION; CRYSTAL STRUCTURE; POINT DEFECTS;

EID: 33846906449     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.11.013     Document Type: Article
Times cited : (22)

References (22)
  • 22
    • 33846907963 scopus 로고    scopus 로고
    • P.J. Cooper, unpublished results, 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.