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Volumn 572, Issue 1 SPEC. ISS., 2007, Pages 277-280

Development of deep N-well monolithic active pixel sensors in a 0.13 μ m CMOS technology

(43)  Bettarini, S a   Bardi, A a   Batignani, G a   Bosi, F a   Calderini, G a   Cenci, R a   Dell'Orso, M a   Forti, F a   Giannetti, P a   Giorgi, M A a   Lusiani, A a,b   Marchiori, G a   Morsani, F a   Neri, N a   Paoloni, E a   Rizzo, G a   Walsh, J a   Andreoli, C c,e   Pozzati, E c,e   Ratti, L c,e   more..


Author keywords

Charged particle tracking; CMOS pixels; MAPS; Monolithic active pixel sensors

Indexed keywords

CMOS INTEGRATED CIRCUITS; IONIZING RADIATION; MICROPROCESSOR CHIPS; RADIATION DETECTORS; SIGNAL PROCESSING;

EID: 33846894519     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.10.302     Document Type: Article
Times cited : (7)

References (8)
  • 8
    • 33846935262 scopus 로고    scopus 로고
    • Software Release 9.0 User's Manual, ISE TCAD, ISE Integrated System Engineering AG, Zurich, CH, Switzerland.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.