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Volumn 568, Issue 1, 2006, Pages 159-166

Monolithic pixel detectors in a 0.13 μ m CMOS technology with sensor level continuous time charge amplification and shaping

Author keywords

Charged particle tracking; CMOS pixels; MAPS

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CHARGE; ELECTRIC SHIELDING; ELECTRODES; INTEGRATED CIRCUIT LAYOUT; PARTICLE BEAM TRACKING;

EID: 33750283274     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.05.225     Document Type: Article
Times cited : (54)

References (12)
  • 8
    • 33750324919 scopus 로고    scopus 로고
    • E.G. Villani, et al., 2004 IEEE NSS Conference Record, N28-1.
  • 9
    • 33750284464 scopus 로고    scopus 로고
    • 〈http://www-ppd.fnal.gov/EEDOffice-w//conferences/FEE_2003/FEE2003talks//C3_Faccio.pdf〉.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.