Charged particle detection using a CMOS active pixel sensor

IEEE Transactions on Nuclear Science

Volumn 50, Issue 4 II, 2003, Pages 1020-1025

  Matis, Howard S ^a   Bieser, Fred ^a   Kleinfelder, Stuart ^b   Rai, Gulshan ^a   Retiere, Fabrice ^a   Ritter, Hans Georg ^a   Singh, Kunal ^a   Wurzel, Samuel E ^a   Wieman, Howard ^a   Yamamoto, Eugene ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Active pixel sensor; CMOS integrated circuit; Heavy ions; Particle tracking; Proton radiation effects; Semiconductor device radiation effects; Semiconductor radiation detectors; Vertex detectors; X ray image sensor

Indexed keywords

CMOS INTEGRATED CIRCUITS; HEAVY IONS; LEAKAGE CURRENTS; PROTON IRRADIATION; RADIATION DAMAGE; SENSORS; SHOT NOISE;

VERTEX DETECTORS;

PARTICLE DETECTORS;

EID: 0042427409     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.815159     Document Type: Conference Paper

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