The effect of annealing on tin whisker growth

IEEE Transactions on Electronics Packaging Manufacturing

Volumn 29, Issue 4, 2006, Pages 252-258

  Fukuda, Yuki ^a,b   Osterman, Michael ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b Philips Lumileds Lighting Company   (United States)

Author keywords

Annealing; Matte tin; Simulated reflow; Tin whiskers; Whisker density; Whisker length

Indexed keywords

CRYSTAL GROWTH; CRYSTAL WHISKERS; HIGH TEMPERATURE EFFECTS; MORPHOLOGY; SURFACES;

MATTE TIN; SIMULATED REFLOW; TIN WHISKERS; WHISKER DENSITY; WHISKER LENGTH;

TIN;

EID: 33846892992     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEPM.2006.887390     Document Type: Article

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