Synchrotron radiation-based irradiance calibration from 200 to 400 nm at the Synchrotron Ultraviolet Radiation Facility III

Applied Optics

Volumn 46, Issue 1, 2007, Pages 25-35

  Shaw, Ping Shine ^a   Arp, Uwe ^a   Saunders, Robert D ^a   Shin, Dong Joo ^a,b   Yoon, Howard W ^a   Gibson, Charles E ^a   Li, Zhigang ^a   Parr, Albert C ^a   Lykke, Keith R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DEUTERIUM; IRRADIATION; SYNCHROTRON RADIATION; ULTRAVIOLET DETECTORS; ULTRAVIOLET LAMPS;

DEUTERIUM LAMPS; IRRADIANCE CALIBRATION; IRRADIANCE MEASUREMENTS; MEASUREMENT UNCERTAINTY;

ULTRAVIOLET RADIATION;

EID: 33846883277     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.000025     Document Type: Article

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