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Volumn 29, Issue 4, 2006, Pages 265-273

Microstructure-based stress modeling of tin whisker growth

Author keywords

Finite element method (FEM); Lead free; Package; Pb free; Sn whisker; Strain energy density; Stress; Tin whisker; Voronoi diagram; X ray diffraction (XRD)

Indexed keywords

ANISOTROPY; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTAL WHISKERS; ELASTICITY; FINITE ELEMENT METHOD; PLASTICITY; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

EID: 33846878525     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEPM.2006.887393     Document Type: Article
Times cited : (30)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.