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Volumn 87, Issue 7, 2005, Pages

High resolution, high collection efficiency in numerical aperture increasing lens microscopy of individual quantum dots

Author keywords

[No Author keywords available]

Indexed keywords

CONFOCAL MICROSCOPY; FOCAL PLANE; NUMERICAL APERTURE; SOLID IMMERSION;

INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; SEMICONDUCTOR QUANTUM DOTS; SPECTROSCOPIC ANALYSIS; SURFACE PHENOMENA;

PHOTOLUMINESCENCE;

EID: 24144474626 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2012532 Document Type: Article

Times cited : (38)

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