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Volumn 448, Issue 1-2, 2007, Pages 303-314

Indentation and imprint mapping for the identification of constitutive parameters of thin layers on substrate: Perfectly bonded interfaces

Author keywords

Imprint mapping; Indentation; Inverse analysis; Material properties; Thin film

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; FINITE ELEMENT METHOD; INDENTATION; INVERSE PROBLEMS; MATHEMATICAL MODELS; MECHANICAL PROPERTIES; OPTIMIZATION; SUBSTRATES;

EID: 33846783199     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.10.061     Document Type: Article
Times cited : (24)

References (33)
  • 25
    • 85161716382 scopus 로고    scopus 로고
    • The Math Works Inc., USA, Matlab 2004, User's Guide and Optimization Toolbox, Release 6.13, 2004
  • 32
    • 85161722245 scopus 로고    scopus 로고
    • HKS Inc., Pawtucket, RI, USA, ABAQUS/Standard, Theory and User's Manuals, Release 6.5-1, 2005.
  • 33
    • 0035482520 scopus 로고    scopus 로고
    • Gee M.G. Wear 250 (2001) 264-281
    • (2001) Wear , vol.250 , pp. 264-281
    • Gee, M.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.