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Volumn 448, Issue 1-2, 2007, Pages 303-314
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Indentation and imprint mapping for the identification of constitutive parameters of thin layers on substrate: Perfectly bonded interfaces
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Author keywords
Imprint mapping; Indentation; Inverse analysis; Material properties; Thin film
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Indexed keywords
ALGORITHMS;
COMPUTER SIMULATION;
FINITE ELEMENT METHOD;
INDENTATION;
INVERSE PROBLEMS;
MATHEMATICAL MODELS;
MECHANICAL PROPERTIES;
OPTIMIZATION;
SUBSTRATES;
FINITE STRAIN REGIME;
INPRINT MAPPING;
INVERSE ANALYSIS;
THIN FILMS;
ALGORITHMS;
COMPUTER SIMULATION;
FINITE ELEMENT METHOD;
INDENTATION;
INVERSE PROBLEMS;
MATHEMATICAL MODELS;
MECHANICAL PROPERTIES;
OPTIMIZATION;
SUBSTRATES;
THIN FILMS;
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EID: 33846783199
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.msea.2006.10.061 Document Type: Article |
Times cited : (24)
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References (33)
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