Structures and dielectric properties of Bi1.5Zn 1.0Nb1.5-xTixO7 (x=0, 0.05, and 0.10) thin films

Applied Physics Letters

Volumn 90, Issue 4, 2007, Pages

  Zhang, Shan Tao ^a   Yi Zhang, ^a   Lu, Ming Hui ^a   Chen, Yan Feng ^a   Liu, Zhi Guo ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; MEASUREMENT THEORY; PERMITTIVITY; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SUBSTITUTION REACTIONS; THIN FILMS; TITANIUM; X RAY DIFFRACTION ANALYSIS;

ROOM TEMPERATURE DIELECTRIC CONSTANT; SCANNING ELECTRON MICROSCOPY MEASUREMENTS;

BISMUTH COMPOUNDS;

EID: 33846646583     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2433762     Document Type: Article

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