Surface quality and surface waves on subwavelength-structured silver films

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 75, Issue 1, 2007, Pages

  Gay, G ^a   Alloschery, O ^a   Weiner, J ^a   Lezec, H J ^b,c   O'Dwyer, C ^d   Sukharev, M ^e   Seideman, T ^e  

^a UNIVERSITÉ DE TOULOUSE   (France)

^b California Institute of Technology   (United States)

^c CNRS   (France)

^d UNIVERSITY COLLEGE CORK   (Ireland)

^e NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE DIFFERENCE METHOD; INTERFEROMETRY; SILVER; SURFACE STRUCTURE; SURFACE WAVES; TIME DOMAIN ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

FAR FIELD INTERFEROMETRY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; STRUCTURED SILVER FILMS; SURFACE QUALITY;

METALLIC FILMS;

EID: 33846518159     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.75.016612     Document Type: Article

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