Quantitative analysis of defects and domain boundaries in mesoporous SBA-16 films

Micron

Volumn 38, Issue 4, 2007, Pages 362-370

  Wang, R H ^a   Chen, Q ^b   Chen, F R ^c   Kai, J J ^c   Peng, L M ^a,b  

^a INSTITUTE OF PHYSICS   (China)

^b PEKING UNIVERSITY   (China)

^c NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Defect analysis; Geometric phase method; Mesoporous materials

Indexed keywords

CHEMICAL ANALYSIS; CRYSTAL DEFECTS; GEOMETRY; GRAIN BOUNDARIES; MESOPOROUS MATERIALS; VECTORS;

DEFECT ANALYSIS; GEOMETRIC PHASE METHOD; ROTATIONAL FIELD;

THIN FILMS;

EID: 33846438677     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2006.06.005     Document Type: Article

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