RHEED wave functions and the effect of reconstruction on secondary electron emission from the Si(1 0 0) surface

Surface Science

Volumn 601, Issue 3, 2007, Pages 822-829

  Kawamura, T ^a   Maksym, P A ^b  

^a UNIVERSITY OF YAMANASHI   (Japan)

^b UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

Electron solid diffraction; RHEED; RHEED electron intensity; RHEED wave function; Silicon

Indexed keywords

ELECTRON BEAMS; ELECTRON EMISSION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY;

REFLECTION MATRIX METHOD; RHEED ELECTRON INTENSITY; RHEED WAVE FUNCTION;

SEMICONDUCTING SILICON;

EID: 33846399682     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.11.023     Document Type: Article

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