Origin of the domain contrast on a Si(001)-2 × 1 surface imaged by secondary electrons

Applied Physics Letters

Volumn 78, Issue 9, 2001, Pages 1255-1257

  Watanabe, Heiji ^a   Ichikawa, Masakazu ^b   Kawamura, Takaaki ^c  

^a NEC CORPORATION   (Japan)

^b JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^c UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347608252     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1352050     Document Type: Article

References (10)

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