Proton Induced Single Event Upset in a 4M SOI SRAM

IEEE International SOI Conference

Volumn , Issue , 2003, Pages 26-27

  Liu, H Y ^a   Liu, S T ^a   Golke, K W ^a   Nelson, D K ^a   Heikkila, W W ^a   Jenkins, W C ^b  

^a HONEYWELL   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY TRANSFER; FEEDBACK CONTROL; GATES (TRANSISTOR); MONTE CARLO METHODS; PROTONS; RANDOM ACCESS STORAGE;

LINEAR ENERGY TRANSFER (LET);

SILICON ON INSULATOR TECHNOLOGY;

EID: 0142217094     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/soi.2003.1242884     Document Type: Conference Paper

References (6)

1. J. F. Ziegler, Handbook of Stopping Cross-sections for Energetic Ions in All Elements, Vol.5, p. 7, Pergamon press (1980).
2. P.M. O'Neill, et al., IEEE Trans. Nuc. Sci. Vol. 45, No. 6, p. 2467 (1998).
3. SmartSPICE/UTMOS III Modeling Manual, Volume III, Silvaco International (2002).
4. PJ. McNulty, et al., Radiat. Phys Chem., 43, No. 1/2, p.139(1994).
5. H. H. K.Tang, et al., Phys. Rev. C, 42, No.1, p.5984 (1990).
6. E. L. Peterson, et al., IEEE Trans. Nuc. Sci., Vol. NS-27, No. 6, p.1494 (1980).