Analysis of single events effects on monolithic PLL frequency synthesizers

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3539-3543

  Chung, Hoon Hee ^a   Chen, Wenjian ^a   Bakkaloglu, Bertan ^a   Barnaby, Hugh J ^a   Vermeire, Bert ^a   Kiaei, Sayfe ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Hold in range; Lock in range; Phase locked loop (PLL); Radiation effects; Single event effect (SEE); VCO

Indexed keywords

FREQUENCY SYNTHESIZERS; MONOLITHIC INTEGRATED CIRCUITS; RADIATION EFFECTS; SIGNAL PROCESSING; VARIABLE FREQUENCY OSCILLATORS;

HOLD-IN RANGE; LOCK-IN RANGE; RADIO FREQUENCY; SINGLE EVENT EFFECT (SEE);

PHASE LOCKED LOOPS;

EID: 33846290984     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.886217     Document Type: Conference Paper

References (4)

1. W. Chen, V. Pouget, H. J. Barnaby, J. D. Cressler, G. Niu, P. Fouillat, Y. Deval, and D. Lewis, "Investigation of single-event transients in voltage-controlled oscillators," IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2081-2087, Dec. 2003.
2. F. M. Gardner, Phaselock Techniques, 3rd ed. New York: Wiley, 2005.
3. D. H. Wolaver, Phase-Locked Loop Circuit Design, 3rd ed. Englewood Cliffs, NJ: Prentice Hall, 1991.
4. P. Adell, R. D. Schrinpf, and H. J. Barnaby, "Analysis of single event transients in analog circuits," IEEE Trans Nucl. Sci., vol. 47, pp. 2616-2623, Dec. 2000.