메뉴 건너뛰기




Volumn 2005, Issue , 2005, Pages 366-371

Improvements in Au wire bondability of rigid and flexible substrates using plasma cleaning

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; ELECTRONICS PACKAGING; INPUT OUTPUT PROGRAMS; WIRE;

EID: 33846279756     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2005.1564609     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 1
    • 0031328164 scopus 로고    scopus 로고
    • Performance and reliability of a cavity down tape BGA package
    • R.D. Schueller, D. Aeschliman, and C.T. Han, "Performance and reliability of a cavity down tape BGA package," Proc. IEEE EPTC, pp.151-162, 1997.
    • (1997) Proc. IEEE EPTC , pp. 151-162
    • Schueller, R.D.1    Aeschliman, D.2    Han, C.T.3
  • 3
    • 84960387718 scopus 로고    scopus 로고
    • Effects of plasma cleaning on the reliability of wire bonding
    • J.M. Nowful, and S.C. Lok, "Effects of plasma cleaning on the reliability of wire bonding," Int. Sym. Electron. Mater. Packag., pp. 39-43, 2001.
    • (2001) Int. Sym. Electron. Mater. Packag , pp. 39-43
    • Nowful, J.M.1    Lok, S.C.2
  • 4
    • 1542304205 scopus 로고
    • The correlation between bond reliability and solid phase bonding techniques for contaminated bonding surfaces
    • D.W. Bushmire, and P.H. Holloway, "The correlation between bond reliability and solid phase bonding techniques for contaminated bonding surfaces," Proc. Int. Sym. Microelectron., pp.402-407, 1975.
    • (1975) Proc. Int. Sym. Microelectron , pp. 402-407
    • Bushmire, D.W.1    Holloway, P.H.2
  • 5
    • 0021540518 scopus 로고
    • The effects of ionic and organic contamination on wirebond reliability
    • J.K. Nesheim, "The effects of ionic and organic contamination on wirebond reliability," Proc. 1984 Int. Sym. Microelectr., pp.70-78, 1984.
    • (1984) Proc. 1984 Int. Sym. Microelectr , pp. 70-78
    • Nesheim, J.K.1
  • 7
    • 0027808451 scopus 로고
    • High reliability wire bonding technology y the 120kHz frequency of ultrasonic
    • Y. Shirai, K. Otsuka, T. Araki, I. Seki, K. Kikuhi, N. Fujita, and T. Miwa, "High reliability wire bonding technology y the 120kHz frequency of ultrasonic," Proc. ICEMM, pp.366-277, 1993.
    • (1993) Proc. ICEMM , pp. 366-277
    • Shirai, Y.1    Otsuka, K.2    Araki, T.3    Seki, I.4    Kikuhi, K.5    Fujita, N.6    Miwa, T.7
  • 9
    • 0035415836 scopus 로고    scopus 로고
    • Effects of metallization characteristics on gold wire bondability of organic printed circuit boards
    • J.K. Kim, and B. P.L. Au, "Effects of metallization characteristics on gold wire bondability of organic printed circuit boards," J. Electron. Mater., vol. 30, pp. 1001-1011, 2001.
    • (2001) J. Electron. Mater , vol.30 , pp. 1001-1011
    • Kim, J.K.1    Au, B.P.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.