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Volumn , Issue , 2001, Pages 39-43
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Effects of plasma cleaning on the reliability of wire bonding
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Author keywords
[No Author keywords available]
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Indexed keywords
BONDING;
CHARACTERIZATION;
CLEANING;
CONTACT ANGLE;
ELECTRONICS PACKAGING;
MODIFIED ATMOSPHERE PACKAGING;
PACKAGING MATERIALS;
RELIABILITY;
SHEAR FLOW;
BALL SHEAR STRENGTH;
PARAMETER-TUNING;
PLASMA CLEANING;
PROCESSING PARAMETERS;
PULL STRENGTH;
SURFACE CHARACTERISTICS;
WIRE BONDING;
WIRE BONDS;
WIRE;
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EID: 84960387718
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EMAP.2001.983955 Document Type: Conference Paper |
Times cited : (23)
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References (8)
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