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Volumn , Issue , 2001, Pages 39-43

Effects of plasma cleaning on the reliability of wire bonding

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; CHARACTERIZATION; CLEANING; CONTACT ANGLE; ELECTRONICS PACKAGING; MODIFIED ATMOSPHERE PACKAGING; PACKAGING MATERIALS; RELIABILITY; SHEAR FLOW;

EID: 84960387718     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EMAP.2001.983955     Document Type: Conference Paper
Times cited : (23)

References (8)
  • 3
    • 1542304197 scopus 로고
    • Kinetics of Thermo-compression Bonding to Organic Contaminated Gold Surfaces
    • James L. Jellison, "Kinetics of Thermo-compression Bonding to Organic Contaminated Gold Surfaces," Proc. Electronic Components Conference, 1976, pp. 92-97.
    • (1976) Proc. Electronic Components Conference , pp. 92-97
    • Jellison, J.L.1
  • 4
    • 1542304205 scopus 로고
    • The Correlation between Bond Reliability and Solid Phase Bonding Techniques for Contaminated Bonding Surfaces
    • Orlando, Florida, October
    • Bushmire, D. W. and Holloway, P. H., "The Correlation between Bond Reliability and Solid Phase Bonding Techniques for Contaminated Bonding Surfaces," Proc. International Microelectronics Symposium (ISHM), Orlando, Florida, October 1975, pp. 402-407.
    • (1975) Proc. International Microelectronics Symposium (ISHM) , pp. 402-407
    • Bushmire, D.W.1    Holloway, P.H.2
  • 5
    • 84960455911 scopus 로고    scopus 로고
    • DC Hydrogen Plasma Cleaning: A Novel Process for IC Packaging
    • San Jose CA, July
    • Nico Onda, Zeno stossel, Alex Dommann and Jurgen Ramm, "DC Hydrogen Plasma Cleaning: A Novel Process for IC Packaging," Proc. Semicon-West, San Jose CA, July 1997.
    • (1997) Proc. Semicon-West
    • Onda, N.1    Stossel, Z.2    Dommann, A.3    Ramm, J.4
  • 6
    • 0003314746 scopus 로고    scopus 로고
    • Influence of Surface Contamination on Metal/Metal Bond Contact Quality
    • Schneuwly, P.Groning, L.Schlapbach, and V.P.Jackelin, "Influence of Surface Contamination on Metal/Metal Bond Contact Quality," Journal of Electronic Materials, Vol. 27, No. 8 (1998), pp. 990-999.
    • (1998) Journal of Electronic Materials , vol.27 , Issue.8 , pp. 990-999
    • Schneuwly1    Groning, P.2    Schlapbach, L.3    Jackelin, V.P.4
  • 7
    • 85026995082 scopus 로고
    • Influence of Codeposited Impurities on Thermo-compression Bonding of Electroplated Gold
    • Dini, J. W., and Johnson, H. R., "Influence of Codeposited Impurities on Thermo-compression Bonding of Electroplated Gold," Thin Solid Films, Vol. 45 (1977), pp. 59-68.
    • (1977) Thin Solid Films , vol.45 , pp. 59-68
    • Dini, J.W.1    Johnson, H.R.2
  • 8
    • 0003422964 scopus 로고
    • Control of Surface Quality of Gold Electrodeposits Utilizing Auger Electron Spectroscopy
    • Casey, D. J., and Endicott, D. W., "Control of Surface Quality of Gold Electrodeposits Utilizing Auger Electron Spectroscopy," Plating and Surface Finishing, Vol. 67 (1980), pp. 39-42.
    • (1980) Plating and Surface Finishing , vol.67 , pp. 39-42
    • Casey, D.J.1    Endicott, D.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.