Study of polycrystalline ZnTe (ZnTe:Cu) thin films for photovoltaic cells

Journal of Materials Science: Materials in Electronics

Volumn 18, Issue 4, 2007, Pages 427-431

  Wang, Wenwu ^a   Xia, Gengpei ^a   Zheng, Jiagui ^a   Feng, Lianghuan ^a   Hao, Ruiying ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL LATTICES; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; PHOTOVOLTAIC CELLS; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

AS-DEPOSITED FILMS; CONDUCTIVITY-TEMPERATURE RELATIONSHIP; VACUUM CO-EVAPORATION TECHNOLOGY;

POLYCRYSTALLINE MATERIALS;

EID: 33846119168     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-006-9044-0     Document Type: Article

References (7)

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