Increasing the laser-induced damage threshold of single-crystal ZnGeP2

Journal of the Optical Society of America B: Optical Physics

Volumn 23, Issue 11, 2006, Pages 2310-2316

  Zawilski, Kevin T ^a   Setzler, Scott D ^a   Schunemann, Peter G ^a   Pollak, Thomas M ^a  

^a BAE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LASER PULSES; OPTICAL PARAMETRIC OSCILLATORS; PHOTONS; SEMICONDUCTING ZINC COMPOUNDS; SINGLE CRYSTALS; SURFACE ROUGHNESS;

LASER-INDUCED DAMAGE THRESHOLD; PHOTON BACKSCATTER; PULSE RATE FREQUENCY; ZINC GERMANIUM PHOSPHIDE;

LASER DAMAGE;

EID: 33846029520     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.23.002310     Document Type: Article

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