An application of cesium-xenon co-sputtering: Quantitative study of a Pd-Rh thin film by ToF-SIMS

Surface and Interface Analysis

Volumn 38, Issue 12-13, 2006, Pages 1654-1657

  Brison, J ^a   Hubert, R ^a   Lucas, S ^a   Houssiau, L ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

Author keywords

Cesium; Ionization; MCs; Pd; Quantification; Rh; ToF SIMS

Indexed keywords

CESIUM COMPOUNDS; ELECTRON TUNNELING; IONIZATION; MATHEMATICAL MODELS; PALLADIUM; RHODIUM; SECONDARY ION MASS SPECTROMETRY; SPUTTER DEPOSITION; XENON;

CESIUM BEAM CONCENTRATION; CO-SPUTTERING; MOLECULAR IONS; TUNNELING MODELS;

THIN FILMS;

EID: 33845955308     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2416     Document Type: Conference Paper

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