Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 240, Issue 1-2, 2005, Pages 420-424

  Hubert, R L ^a   Brison, J ^a   Houssiau, L ^a   Lucas, S ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

Author keywords

Depth profile; Interdiffusion; PIXE; RBS; ToF SIMS

Indexed keywords

ION IMPLANTATION; MAGNETRONS; PALLADIUM; RADIOACTIVE MATERIALS; RHODIUM; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; TUMORS;

DEPTH PROFILES; INTERDIFFUSION; PIXE; TOF-SIMS;

DIFFUSION;

EID: 27444437582     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.06.167     Document Type: Conference Paper

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