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Volumn 19, Issue 1, 2001, Pages 246-250
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Structural characterization of polycrystalline Cd-Te-In films
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
COMPOSITION EFFECTS;
CRYSTAL STRUCTURE;
ELECTRIC CONDUCTIVITY OF SOLIDS;
EVAPORATION;
FILM GROWTH;
POLYCRYSTALLINE MATERIALS;
SOLID SOLUTIONS;
STOICHIOMETRY;
THERMAL EFFECTS;
TRANSPORT PROPERTIES;
X RAY SPECTROSCOPY;
CLOSED SPACE VAPOR TRANSPORT;
FREE EVAPORATION TECHNIQUE;
INCORPORATION;
POLYCRYSTALLINE CADMIUM TELLURIUM INDIUM FILMS;
RIETVELD METHOD;
SEMICONDUCTING CADMIUM COMPOUNDS;
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EID: 0035109213
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1322643 Document Type: Article |
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Times cited : (6)
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References (2)
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