Atomic scale patterns formed during surface scanning by atomic force microscopy tips

Applied Physics Letters

Volumn 89, Issue 25, 2006, Pages

  Teschke, Omar ^a   Soares, David Mendez ^a   Valente Filho, Juracyr Ferraz ^a   De Souza, Elizabeth Fátima ^b  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b PONTIFÍCIA UNIVERSIDADE CATÓLICA DE CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; OPTICAL RESOLVING POWER; PERMITTIVITY; SCANNING; SUBSTRATES;

ATOMIC RESOLUTION; IMAGE ACQUISITION; PATTERN FORMATION;

INTERFACES (MATERIALS);

EID: 33845920260     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2423245     Document Type: Article

References (16)

1. C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. 59, 1942 (1987).
2. R. W. Carpick and M. Salmeron, Chem. Rev. (Washington, D.C.) 97, 1163 (1997).
3. H. Holscher, U. D. Schwarz, O. Zworner, and R. Wiesendanger, Phys. Rev. B 57, 2477 (1998).
4. M. Ishikawa, S. Okita, N. Minami, and K. Miura, Surf. Sci. 445, 488 (2000).
5. H. Holscher, U. D. Schwarz, and R. Wiesendanger, Europhys. Lett. 36, 19 (1996).
6. K. L. Johnson and J. Woodhouse, Tribol. Lett. 5, 155 (1998).
7. H. Takano and M. Fujihira, J. Vac. Sci. Technol. B 14, 1272, (1996).
8. R. M. Overney, H. Takano, M. Fujihira, W. Paulus, and H. Ringsdorf, Phys. Rev. Lett. 72, 3546 (1994).
9. O. Teschke and E. F. Souza, Rev. Sci. Instrum. 69, 3588 (1998).
10. E. Meyar, R. M. Overney, K. Dransfeld, and T. Gyalog, Nanoscience (World Scientific, Singapore, 2002), Chap., 337.
11. E. F. de Souza, R. A. Douglas, and O. Teschke, Langmuir 13, 6012 (1997).
12. O. Teschke, R. A. Douglas, and T. A. Prolla, Appl. Phys. Lett. 70, 1977 (1997).
13. O. Teschke, G. Ceotto, and E. F. de Souza, Appl. Phys. Lett. 78, 3064 (2001).
14. O. Teschke and E. F. de Souza, Phys. Chem. Chem. Phys. 7, 3856 (2005).
15. O. Teschke, G. Ceotto, and E. F. de Souza, Chem. Phys. Lett. 326, 328 (2000).
16. O. Teschke and E. F. de Souza, Chem. Phys. Lett. 403, 95 (2005).