Test and analysis of optical film constants

Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering

Volumn 35, Issue 5, 2006, Pages 513-518

  Ji, Yi Qin ^a   Liu, Hua Song ^a   Zhang, Yan Min ^a  

^a TIANJIN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Fitting; Optical constant; Test and analysis; Transmission spectrum

Indexed keywords

EXTINCTION COEFFICIENTS; OPTICAL CONSTANTS; OXIDE FILM MATERIALS;

COMPUTATION THEORY; LIGHT EXTINCTION; LIGHT TRANSMISSION; REFRACTIVE INDEX; SPECTROPHOTOMETERS; SPECTRUM ANALYSIS; THIN FILMS;

OPTICAL FILMS;

EID: 33845918976     PISSN: 10072276     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

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8. SHEN Wei -dong,LIU Xu,YE Hui,et al.A new method for determination of the optical constants and thickness of thin film [J].Acta Optica Sinica, 2004, 24(7), 885-889.