Visible luminescence of nanocrystalline AlN:Er thin film by co-deposition of AlN, Er, and SiO2

Current Applied Physics

Volumn 7, Issue 3, 2007, Pages 236-239

  Lim, J W ^a   Takayama, W ^b   Zhu, Y F ^a   Bae, J W ^a   Wang, J F ^a   Ji, S Y ^a   Mimura, K ^a   Yoo, J H ^c   Isshiki, M ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN RADIO CO LTD   (Japan)

^c National Nano Fab Center (NNFC)   (South Korea)

Author keywords

Aluminium nitride; Deposition; Erbium; Luminescence; Thin film

Indexed keywords

ALUMINUM NITRIDE; AMORPHOUS MATERIALS; ANNEALING; DEPOSITION; ERBIUM; LUMINESCENCE; NANOSTRUCTURED MATERIALS; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLITE DIAMETERS; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; RECOMBINATION PROCESS;

THIN FILMS;

EID: 33845898896     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2006.05.003     Document Type: Article

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