Parametric surface-source modeling and estimation with electroencephalography

IEEE Transactions on Biomedical Engineering

Volumn 53, Issue 12, 2006, Pages 2414-2424

  Cao, Nannan ^a,b   Yetik, Imam Şamil ^c   Nehorai, Arye ^a   Muravchik, Carlos H ^d   Haueisen, Jens ^e,f  

^a WASHINGTON UNIVERSITY IN ST LOUIS   (United States)

^b Campus Box 1127 ^*  (United States)

^c Illinois Institute of Technology   (United States)

^d UNIVERSIDAD NACIONAL DE LA PLATA   (Argentina)

^e JENA UNIVERSITY HOSPITAL   (Germany)

^f ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Cram r Rao bounds; EEG; Extended source modeling; Likelihood ratio test

Indexed keywords

BOUNDARY ELEMENT METHOD; COMPUTER SIMULATION; DIAGNOSIS; ELECTRIC VARIABLES MEASUREMENT; MAXIMUM LIKELIHOOD ESTIMATION; MEDICAL APPLICATIONS;

CRAME-RAO BOUNDS; EXTENDED SOURCE MODELING; LIKELIHOOD RATIO TEST;

ELECTROENCEPHALOGRAPHY;

ARTICLE; DIAGNOSTIC VALUE; DIPOLE; ELECTRIC ACTIVITY; ELECTROCARDIOGRAM; EPILEPSY; MAXIMUM LIKELIHOOD METHOD; PARAMETRIC TEST; PHANTOM; PROBLEM SOLVING;

ACTION POTENTIALS; ALGORITHMS; BRAIN; COMPUTER SIMULATION; DIAGNOSIS, COMPUTER-ASSISTED; ELECTROENCEPHALOGRAPHY; HEAD; HUMANS; MODELS, NEUROLOGICAL; SURFACE PROPERTIES;

EID: 33845880153     PISSN: 00189294     EISSN: None     Source Type: Journal    
DOI: 10.1109/TBME.2006.883741     Document Type: Article

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