A new method to achieve improved accuracy with IBIS models

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn 2005, Issue , 2005, Pages 119-122

  Varma, Ambrish ^a   Steer, Michael ^a   Franzon, Paul ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GROUND BOUNCE; NORTH CAROLINA STATE UNIVERSITY; SIMULTANEOUS SWITCHING NOISE (SSN);

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELECTRIC POWER DISTRIBUTION; EQUIVALENT CIRCUITS; SWITCHING FUNCTIONS;

BUFFER CIRCUITS;

EID: 33845877432     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPEP.2005.1563716     Document Type: Conference Paper

References (7)

1. "SSN issues with IBIS models" Varma, A.; Steer, M.; Franzon, P.; Electrical Performance of Electronic Packaging, 25-27 Oct. 2004.
2. Adding On-Chip Capacitance in IBIS Format for SSO Simulations. Raymond Y. Chen DesignCon 2004 - IBIS Summit.
3. th Tropical Meeting on Electrical Performance of Electronic Packaging (EPEP 2003), Princeton, New Jersey, pp. 277-280, October, 2003.
4. Simultaneous Switching Noise of CMOS Devices and Systems. Ramesh Senthinathan and John L. Prince. Kluwer Academic Publishers, 1994.
5. Avanti, Star-HSpice manual Release 2001.2.
6. "LVDS I/O Interface for Gb/s-per-Pin Operation in 0.35-_m CMOS". Andrea Boni, Andrea Pierazzi, and Davide Vecchi, IEEE Journal Of Solid-State Circuits, Vol. 36, No. 4, April 2001
7. "Details on True Differential Buffer Characterization Revisited". Arpad Muranyi, IBIS Summit at PCB Conference East Westford, MA October 21, 2003.