SSN issues with IBIS models

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 2004, Pages 87-90

  Varma, Ambrish ^a   Steer, Michael ^a   Franzon, Paul ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL DRIVERS; FINITE TIME DIFFERENCE APPROXIMATIONS; SIMULTANEOUS SWITCHING NOISE (SSN); SIMULTANEOUS SWITCHING OUTPUT (SSO);

APPROXIMATION THEORY; COMPUTER SIMULATION; DATA REDUCTION; DIGITAL DEVICES; ELECTRIC POTENTIAL; FINITE DIFFERENCE METHOD; MICROPROCESSOR CHIPS; SPECIFICATIONS; SPURIOUS SIGNAL NOISE; SWITCHING; TRANSISTORS;

CMOS INTEGRATED CIRCUITS;

EID: 15944414588     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Simultaneous Switching Noise of CMOS Devices and Systems. Ramesh Senthinathan and John L. Prince. Kluwer Academic Publishers, 1994.
2. Introduction to IBIS Models, Arpad Muranyi, IBIS Model Training, San Jose, California - April 26, 2000
3. th Tropical Meeting on Electrical Performance of Electronic Packaging (EPEP 2003), Princeton, New Jersey, pp. 277-280, October, 2003.
4. An Experimental Procedure to Derive Reliable IBIS Models, Zak, T.; Ducrot, M.; Xavier, C.; Drissi, M:, Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd , 5-7 Dec 2000.
5. Macro-Modeling of Non-Linear I/O Drivers using Spline Functions and Finite Time Difference Approximation. Bhyrav Mutnury, Madhavan Swaminathan and Jim Libous, 12th Tropical Meeting on Electrical Performance of Electronic Packaging (EPEP 2003), Princeton, New Jersey, October, 2003.
6. Avanti, Star-HSpice manual Release 2001.2, chapter 9.
7. Adding On-Chip Capacitance in IBIS Format for SSO Simulations. Raymond Y. Chen DesignCon 2004 - IBIS Summit.