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IEEE Transactions on Microwave Theory and Techniques

Volumn 44, Issue 7 PART 1, 1996, Pages 1155-1157

Reduced invasiveness of noncontact electrooptic probes in millimeter-wave optoelectronic characterization

(3) Zeng, A a Shah, S A a Jackson, M K a

a UNIVERSITY OF BRITISH COLUMBIA (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LINES; ELECTRODES; ELECTROMAGNETIC DISPERSION; ELECTROMAGNETIC WAVE REFLECTION; LITHIUM COMPOUNDS; MEASUREMENT ERRORS; MILLIMETER WAVES; OPTOELECTRONIC DEVICES; PROBES; SENSITIVITY ANALYSIS; STRIP TELECOMMUNICATION LINES; TIME DOMAIN ANALYSIS;

COPLANAR STRIPLINE; ELECTROOPTIC SAMPLING; MEASUREMENT SENSITIVITY; NONCONTACT ELECTROOPTIC PROBES; SIGNAL REFLECTION;

ELECTROOPTICAL DEVICES;

EID: 0030190027 PISSN: 00189480 EISSN: None Source Type: Journal
DOI: 10.1109/22.508652 Document Type: Article

Times cited : (6)

References (8)

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2
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4
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- Experimental characterization of external electrooptic probes
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6
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