X-ray diffraction from epitaxial thin films: An analytical expression of the line profiles accounting for microstructure

Zeitschrift fur Kristallographie

Volumn 221, Issue SUPPL. 23, 2006, Pages 123-128

  Boulle, A ^a   Guinebretiere R ^a   Dauger, A ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

Microstructure; Roughness; Thickness fluctuations; Thin films; X ray diffraction

Indexed keywords

EID: 33845779427     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/9783486992526-023     Document Type: Conference Paper

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