Growth and thermal stability of GaPO4 epitaxial thin films

Applied Physics Letters

Volumn 89, Issue 24, 2006, Pages

  Pedarnig, J D ^a   Roither, S ^a   Peruzzi, M ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; FILM GROWTH; GALLIUM COMPOUNDS; PHASE TRANSITIONS; THERMODYNAMIC STABILITY;

AMORPHOUS STOICHIOMETRIC PRECURSOR LAYERS; OUT-OF-PLANE TEXTURES; QUARTZ SUBSTRATES;

THIN FILMS;

EID: 33845751584     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2404970     Document Type: Article

References (20)

1. P. M. Worsch, B. Koppelhuber-Bitschnau, F. A. Mautner, P. W. Krempl, W. Wallnöfer, P. Doppler, and J. Gautsch, Mater. Sci. Forum 321-324, 914 (2000).
2. T. R. Shrout, R. Eitel, and C. Randall, in Piezoelectric Materials in Devices, edited by, N. Setter, (EPFL Swiss Federal Institute of Technology, Lausanne Switzerland, 2002), pp. 413-432.
3. D. Damjanovic, Curr. Opin. Solid State Mater. Sci. 3, 469 (1998).
4. PIEZOCRYST Advanced Sensorics GmbH, 2006, www.piezocryst.com.
5. P. W. Krempl, G. Voborsky, U. Posch, and W. Wallnöfer, European Patent No. EP 0 586366A1, 23 August 1993.
6. E. Philippot and P. Papet, Ann. Chim. (Paris) 26, 1 (2001)].
7. D. Palmier, A. Goiffon, B. Capelle, J. D́taint, and E. Philippot, J. Cryst. Growth 166, 347 (1996).
8. W. Wallnöfer and P. W. Krempl, IEEE Proceedings of the Eighth European Frequency and Time Forum, Munich, Germany (IEEE, New York, 1994), pp. 110-117.
9. Shin-Ichi Hirano and Pan-Chae Kim, Bull. Chem. Soc. Jpn. 62, 275 (1989).
10. D. Bäuerle, Laser Processing and Chemistry, 3rd ed. (Springer, New York, 2000)
11. M. Peruzzi, J. D. Pedarnig, H. Sturm, N. Huber, and D. Bäuerle, Europhys. Lett. 65, 652 (2004).
12. G. Johnson and J. Foise, in Encyclopedia of Applied Physics, edited by, G. F. Trigg, (Wiley, New York, 2004), Vol. 15, pp. 365-375.
13. K. Jacobs, P. Hofmann, D. Klimm, J. Reichow, and M. Schneider, J. Solid State Chem. 149, 180 (2000).
14. International Centre for Diffraction Data (ICDD, www.icdd.com), PDF-2, No. 75-1393, 1998.
15. H. Gleichmann, H. Richert, R. Hergt, R.-U. Barz, M. Grassl, and P. Görnert, Cryst. Res. Technol. 36, 1181 (2001); Hermsdorfer Institut für Technische Keramik e. V., 2006, www.hitk.de.
16. H. Gleichmann, H. Richert, R. Hergt, R.-U. Barz, M. Grassl, and P. Görnert, Cryst. Res. Technol. 36, 1181 (2001); Hermsdorfer Institut für Technische Keramik e. V., 2006, www.hitk.de.
17. O. Hellman, Mater. Sci. Eng., R. 16, 1 (1996).
18. F. Roccaforte, S. Dhar, F. Harbsmeier, and K. P. Lieb, Appl. Phys. Lett. 75, 2903 (1999).
19. G. Devaud, C. Hayzelden, M. J. Aziz, and D. Turnbull, J. Non-Cryst. Solids 134, 129 (1991).
20. S. H. Yun, J. D. Pedarnig, R. Rössler, D. Bäuerle, and X. Obradors, Appl. Phys. Lett. 77, 1369 (2000).