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Volumn 16, Issue 1, 1996, Pages 1-42

Topics in solid phase epitaxy: Strain, structure and geometry

Author keywords

Geometry; Solid phase epitaxy; Strain; Structure

Indexed keywords

ACTIVATION ENERGY; AMORPHIZATION; AMORPHOUS FILMS; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; CRYSTALLIZATION; INTERFACIAL ENERGY; PHASE INTERFACES; REACTION KINETICS; SEMICONDUCTING SILICON COMPOUNDS; SINGLE CRYSTALS; STRAIN;

EID: 0029733573     PISSN: 0927796X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0927-796X(96)80001-5     Document Type: Review
Times cited : (20)

References (193)
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    • Because the indices are irrational, there's no reason to expect a critical point to occur here, i.e. a maximum or minimum in the growth rate. There's also no translation vector of the lattice which corresponds to this direction: hence the word "fictional".
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.