Micro total reflection x-ray fluorescence (μ-TXRF) analysis

X-Ray Spectrometry

Volumn 35, Issue 6, 2006, Pages 375-378

  Tsuji, Kouichi ^a,b   Kawamata, Masaya ^a   Nishida, Yousuke ^a   Nakano, Kazuhiko ^a   Sasaki, Ken Ichi ^c  

^a Osaka City University   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c RIKKYO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; X RAY DETECTORS;

ENERGY DISPERSIVE X-RAY; ENERGY-DISPERSIVE X-RAYS; MICROREGIONS; SAMPLE SURFACE; SIMPLE++; STANDARD SOLUTIONS; TOTAL REFLECTION X-RAY FLUORESCENCE; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS; X-RAY DETECTOR;

FLUORESCENCE;

EID: 33845678547     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.922     Document Type: Conference Paper

References (11)

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