Growth and characterization of CuFeS2 thin films

Journal of Crystal Growth

Volumn 297, Issue 2, 2006, Pages 426-431

  Barkat, L ^a   Hamdadou, N ^a,b   Morsli, M ^b   Khelil, A ^a   Bernede J C ^b  

^a UNIVERSITY OF ORAN   (Algeria)

^b UNIVERSITÉ DE NANTES   (France)

Author keywords

A1. Crystal structure; A1. X ray diffraction; A3. Physical vapour deposition processes

Indexed keywords

CONTAMINATION; COPPER COMPOUNDS; DIFFUSION; EVAPORATION; PYRITES; VACUUM APPLICATIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON MICROPROBE ANALYSIS; OXYGEN CONTAMINATION; SULPHURIZATION; VACUUM EVAPORATION;

THIN FILMS;

EID: 33845625282     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.10.105     Document Type: Article

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