Voltammetry and XPS analysis of a chalcopyrite CuFeS2 electrode

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 140, Issue 1-3, 1998, Pages 369-375

  Velasquez P ^a   Gomez H ^a   Ramos Barrado, J R ^b   Leinen, D ^b  

^a PONTIFICIA UNIVERSIDAD CATÓLICA DE VALPARAÍSO   (Chile)

^b UNIVERSITY OF MÁLAGA   (Spain)

Author keywords

Chalcopyrite CuFeS2; Electrochemistry; Voltammetry; XPS

Indexed keywords

COPPER OXIDES; CYCLIC VOLTAMMETRY; IRON OXIDES; OXIDATION; REDUCTION; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

CHALCOPYRITES;

ELECTROCHEMICAL ELECTRODES;

COPPER SULFATE; SULFITE;

CHILE; COLLOID; CONFERENCE PAPER; ELECTROCHEMICAL ANALYSIS; ELECTRODE; MINING; POTENTIOMETRY; PRIORITY JOURNAL;

EID: 0032582165     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(97)00293-8     Document Type: Conference Paper

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