A CMOS imager with column-level ADC using dynamic column fixed-pattern noise reduction

IEEE Journal of Solid-State Circuits

Volumn 41, Issue 12, 2006, Pages 3007-3015

  Snoeij, Martijn F ^a,b   Theuwissen, Albert J P ^a,b,c   Makinwa, Kofi A A ^a,b   Huijsing, Johan H ^a,b  

^a IEEE   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c DALSA Semiconductors   (Netherlands)

Author keywords

A D conversion; CMOS image sensors; Column FPN reduction; Column level ADCs; Dynamic offset cancellation

Indexed keywords

CIRCUIT ELEMENT; CMOS IMAGER; COLUMN CIRCUIT DESIGN; DYNAMIC COLUMN SWITCHING (DCS); DYNAMIC OFFSET CANCELLATION; SOLID STATE CIRCUITS;

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; IMAGE SENSORS; OPTICAL DESIGN; SWITCHING CIRCUITS;

SOLID STATE DEVICE STRUCTURES;

EID: 33845620276     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2006.884866     Document Type: Conference Paper

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