The time-of-flight photocurrent analysis revisited

Journal of Optoelectronics and Advanced Materials

Volumn 8, Issue 6, 2006, Pages 2028-2034

  Brinza, M ^a,b   Adriaenssens, G J ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b UTRECHT UNIVERSITY   (Netherlands)

Author keywords

Amorphous semiconductors; Analytical modelling; Density of states; Drift mobility; Multiple trapping transport; Time of flight photocurrents

Indexed keywords

ANALYTICAL MODELS; MATERIALS SCIENCE; MECHANICAL PROPERTIES;

CRUDE APPROXIMATIONS; DENSITY OF STATE; DISORDERED SEMICONDUCTORS; DRIFT MOBILITIES; ELECTRONS AND HOLES; MOBILITY-LIFETIME PRODUCTS; MULTIPLE TRAPPING; TIME-OF-FLIGHT PHOTOCURRENTS;

AMORPHOUS SEMICONDUCTORS;

EID: 33845605477     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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