Analysis of electron time-of-flight photocurrent data from a-Se

Journal of Applied Physics

Volumn 99, Issue 8, 2006, Pages

  Emelianova, E V ^a   Benkhedir, M L ^a   Brinza, M ^a   Adriaenssens, G J ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; DEFECTS; ELECTRIC FIELDS; ELECTRON TRAPS;

EMISSION CURRENTS; GAUSSIAN DEFECT BAND; TIME-OF-FLIGHT PHOTOCURRENT;

PHOTOCURRENTS;

EID: 33646735360     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2187395     Document Type: Article

References (6)

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