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Volumn 2006, Issue , 2006, Pages 903-908

Indirect reliability estimation for electric devices via a dynamic "Stress - Strength" model

Author keywords

Classic statistics; Power system components; Reliability; Stress strength models

Indexed keywords

MATHEMATICAL MODELS; PARAMETER ESTIMATION; POWER ELECTRONICS; RELIABILITY; STRESS ANALYSIS;

EID: 33845563101     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SPEEDAM.2006.1649896     Document Type: Conference Paper
Times cited : (7)

References (12)
  • 2
    • 70350323732 scopus 로고
    • Stress-strength models for reliability
    • Krishnaiah P.R., Rao C. R. (ed.), vol. 7: Quality Control and Reliability, North Holland, Amsterdam
    • Johnson R.A.: Stress-Strength Models for Reliability, in: Krishnaiah P.R., Rao C. R. (ed.) Handbook of Statistics, vol. 7: Quality Control and Reliability, North Holland, Amsterdam, 1988.
    • (1988) Handbook of Statistics
    • Johnson, R.A.1
  • 5
    • 32844459813 scopus 로고    scopus 로고
    • Bayesian reliability estimation based on a Weibull stress-strength model for aged power system components subjected to voltage surges
    • February
    • Chiodo E.; Mazzanti G.: Bayesian reliability estimation based on a Weibull stress-strength model for aged power system components subjected to voltage surges, IEEE Trans, on Dielectrics and Electrical Insulation, Vol. 13, pp. 146-159, February 2006.
    • (2006) IEEE Trans, on Dielectrics and Electrical Insulation , vol.13 , pp. 146-159
    • Chiodo, E.1    Mazzanti, G.2
  • 6
    • 33845563902 scopus 로고    scopus 로고
    • A new reliability model for power system components characterized by dynamic stress and strength
    • Taormina (Italy), May
    • Chiodo E.; Mazzanti G.: A new reliability model for power system components characterized by dynamic stress and strength, Proc. 2006 SPEEDAM Symposium, Taormina (Italy), May 2006.
    • (2006) Proc. 2006 SPEEDAM Symposium
    • Chiodo, E.1    Mazzanti, G.2
  • 7
    • 35348922933 scopus 로고    scopus 로고
    • New models for reliability evaluation of power system components subjected to transient overvoltages
    • Montreal (Canada), June
    • Chiodo E.; Mazzanti G.: New models for reliability evaluation of power system components subjected to transient overvoltages, Proc. 2006 IEEE PES General Meeting, Montreal (Canada), June 2006.
    • (2006) Proc. 2006 IEEE PES General Meeting
    • Chiodo, E.1    Mazzanti, G.2
  • 9
    • 0020206757 scopus 로고
    • A probabilistic model of power system disturbances
    • Anderson P.M.; Timko K.J.: A probabilistic model of power system disturbances, IEEE Trans, on Circuits and Systems, Vol. 29, n. 11, p. 789-796, 1982.
    • (1982) IEEE Trans, on Circuits and Systems , vol.29 , Issue.11 , pp. 789-796
    • Anderson, P.M.1    Timko, K.J.2
  • 10
    • 0037333161 scopus 로고    scopus 로고
    • Indirect assessment of system reliability
    • March
    • Ebrahimi N.B.: Indirect assessment of system reliability, IEEE Trans. Reliability, vol. 52, pp. 58-62,March 2003.
    • (2003) IEEE Trans. Reliability , vol.52 , pp. 58-62
    • Ebrahimi, N.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.