Bayesian reliability estimation based on a weibull stress-strength model for aged power system components subjected to voltage surges

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 13, Issue 1, 2006, Pages 146-159

  Chiodo, E ^a,c   Mazzanti, G ^b,d  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITY OF BOLOGNA   (Italy)

^c University of Napoli ^*  (Italy)

^d HV Engineering and Power Quality

Author keywords

Bayesian statistics; Electrical insulation; Gamma; Generalized Gamma; Log logistic distribution; Power system components; Reliability; Stress strength models; Weibull distribution

Indexed keywords

BAYESIAN STATISTICS; GENERALIZED GAMMA; STRESS-STRENGTH MODEL;

COMPUTER SIMULATION; ELECTRIC EQUIPMENT; ELECTRIC POTENTIAL; MONTE CARLO METHODS; RELIABILITY; STRESS ANALYSIS; WEIBULL DISTRIBUTION;

ELECTRIC POWER SYSTEMS;

EID: 32844459813     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2006.1593413     Document Type: Article

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