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Volumn 3, Issue , 2003, Pages 1074-1082

Bayes inference for reliability of HV insulation systems in the presence of switching voltage surges using a Weibull stress-strength model

Author keywords

Bayesian statistics; Electric power transmission; Gamma; Generalized Gamma; HV insulation; reliability; Loglogistic and Weibull distribution; Stress strength models

Indexed keywords

ANALYTICAL DETERMINATION; BAYESIAN APPROACHES; BAYESIAN ESTIMATIONS; BAYESIAN STATISTICS; CABLE INSULATION; ELECTRIC STRENGTH; GAMMA; GENERALIZED GAMMA; INSULATION SYSTEM; INTERVAL ESTIMATE; LOG-LOGISTIC; LOG-LOGISTIC DISTRIBUTION; MONTE CARLO SIMULATION; NUMERICAL APPLICATIONS; POSTERIOR DISTRIBUTIONS; RATED VOLTAGES; RELIABILITY ASSESSMENTS; RELIABILITY EVALUATION; STOCHASTIC NATURE; SWITCHING OVERVOLTAGES; SWITCHING VOLTAGES; VOLTAGE SURGES; WEIBULL;

EID: 84861494559     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PTC.2003.1304524     Document Type: Conference Paper
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.