Barrier height imaging of Si(1 1 1)3 × 1-Ag reconstructed surfaces

Applied Surface Science

Volumn 253, Issue 2, 2006, Pages 651-654

  Furuhashi, Takahisa ^a   Oshima, Yoshifumi ^a   Hirayama, Hiroyuki ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Ag; Barrier height (BH); Decay rate; Scanning tunneling microscopy (STM); Si(1 1 1); Surface local density of state (LDOS)

Indexed keywords

IMAGE ANALYSIS; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SILICON; SILVER;

BARRIER HEIGHT (BH); DECAY RATE; GEOMETRIC CONTRIBUTION; SURFACE LOCAL DENSITY OF STATE (LDOS);

SURFACE STRUCTURE;

EID: 33845407982     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.146     Document Type: Article

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