Local tunneling barrier height image of the Si(111)-(7×7) surface

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 11, 1998, Pages 6186-6187

  Sasaki, Masahiro ^a   Komai, Masaaki ^a   Ozawa, Ryo ^a   Yamamoto, Shigehiko ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Electronic properties; Geometorical structure; Local tunnel barrier height; Scanning tunneling microscopy; Si(111) (7 7)

Indexed keywords

CRYSTAL ORIENTATION; ELECTRONIC PROPERTIES; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

ADATOMS;

SILICON;

EID: 0032203416     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.6186     Document Type: Article

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