Structural characterization of thermally evaporated Bi2Te3 thin films

Journal of Physics and Chemistry of Solids

Volumn 68, Issue 1, 2007, Pages 111-117

  Sathyamoorthy, R ^a   Dheepa, J ^a  

^a KONGUNADU ARTS AND SCIENCE COLLEGE   (India)

Author keywords

A. Bi2Te3 thin films; B. Thermal evaporation; C. Crystalline size; C. Lattice constant; C. X ray scattering

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL STRUCTURE; EVAPORATION; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; POLYCRYSTALLINE MATERIALS; SUBSTRATES; X RAY DIFFRACTION; X RAY SCATTERING;

COORDINATION NUMBER; CRYSTALLITE SIZE; GLASS SUBSTRATES; HEXAGONAL STRUCTURE;

THIN FILMS;

EID: 33845398968     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2006.09.014     Document Type: Article

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