A wavelet based signal processing technique for image enhancement in terahertz imaging data

AIP Conference Proceedings

Volumn 820 I, Issue , 2006, Pages 492-499

  Nair, Naveen V ^a   Melapudi, Vikram R ^a   Vemulapalli, Pramod ^b   Ramakrishnan, Sridhar ^a   Udpa, Lalita ^a   Udpa, Satish S ^a   Winfree, William P ^c  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^c NASA LANGLEY RESEARCH CENTER   (United States)

Author keywords

Signal processing; SOFI (Spray on Foam Insulation) inspection; Terahertz imaging; Wavelets

Indexed keywords

EID: 33845389834     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2184568     Document Type: Conference Paper

References (5)

1. Nicholas Karpowicz et. al., "Comparison between pulsed terahertz time-domain imaging and continuous wave terahertz imaging", Semicond. Sci. Technol., 20, S293-S299, (2005).
2. X-C Zhang, "Terahertz wave imaging: Horizons and Hurdles", Phys. Med. Biol., 47, 3667-3677, (2003).
3. Peter H Siegel, "Terahertz Technology", IEEE Trans. On MTT, 50 (No 3), 910-928, (2002).
4. Timothy D. Dorney, Richard G. Baraniuk, and Daniel M. Mittleman, "Material Parameter estimation with terahertz time-domain spectroscopy", J. Opt. Soc. Am. A., 18 (No. 7), 1562-1571, (2001).
5. st AIAA/ASME/SAE/ASEE Joint Propulsion Conference & Exhibit Event, July 10-13 (2005).