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Volumn 89, Issue 21, 2006, Pages

High filling fraction gallium phosphide inverse opals by atomic layer deposition

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITION; DIELECTRIC CONTRASTS; FILLING FRACTION; PHOSPHINE PRECURSORS;

EID: 33845385119     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2387874     Document Type: Article
Times cited : (39)

References (30)
  • 24
  • 30
    • 33847596250 scopus 로고
    • D. E. Aspnes and A. A. Studna, Phys. Rev. B 27, 985 (1983). Thin film reflectance measurements were used to independently confirm the index of the ALD grown GaP film.
    • (1983) Phys. Rev. B , vol.27 , pp. 985
    • Aspnes, D.E.1    Studna, A.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.