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Volumn 89, Issue 22, 2006, Pages
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Molecular beam epitaxy grown template for subsequent atomic layer deposition of high κ dielectrics
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINA;
CURRENT DENSITY;
HAFNIUM COMPOUNDS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
LEAKAGE CURRENTS;
MOLECULAR BEAM EPITAXY;
PERMITTIVITY;
X RAY PHOTOELECTRON SPECTROSCOPY;
ATOMIC LAYER DEPOSITION (ALD);
COMPOSITE FILMS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
LEAKAGE CURRENT DENSITY;
DIELECTRIC MATERIALS;
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EID: 33751565290
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2397542 Document Type: Article |
Times cited : (19)
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References (6)
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