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Volumn 89, Issue 22, 2006, Pages

Molecular beam epitaxy grown template for subsequent atomic layer deposition of high κ dielectrics

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CURRENT DENSITY; HAFNIUM COMPOUNDS; HIGH RESOLUTION ELECTRON MICROSCOPY; LEAKAGE CURRENTS; MOLECULAR BEAM EPITAXY; PERMITTIVITY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33751565290     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2397542     Document Type: Article
Times cited : (19)

References (6)
  • 3
    • 33751577401 scopus 로고    scopus 로고
    • J. Hauser, CVC NCSU software, Department Electrical Computer Engineering, North Carolina State University, Raleigh, NC, 1996.
    • (1996)
    • Hauser, J.1
  • 5
    • 0001974478 scopus 로고    scopus 로고
    • edited by H. Z.Massoud, E. H.Poindexter, and C. R.Helms (The Electrochemical Society, Pennington, NJ
    • D. A. Buchanan and S.-H. Lo, in The Physics and Chemistry of Si O2 and the Si-Si O2 Interface, edited by, H. Z. Massoud, E. H. Poindexter, and, C. R. Helms, (The Electrochemical Society, Pennington, NJ, 1996), Vol. 3, p. 3.
    • (1996) The Physics and Chemistry of Si O2 and the Si-Si O2 Interface , vol.3 , pp. 3
    • Buchanan, D.A.1    Lo, S.-H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.